The Optris Xi 400 with microscope optics is a high-performance infrared camera system specifically developed for printed circuit board (PCB) analysis and precise electrical component temperature measurement. Combining a long-wave infrared camera with a precision microscope stage and German-designed optics optimised for small targets, it delivers exceptional measurement accuracy within the affordable 382 × 288 pixel resolution class.

In electronics manufacturing and development, components and interconnections are increasingly compact, yet many infrared camera systems are designed with optics suited only to larger targets. The Xi 400 microscope package addresses this limitation by offering an exceptionally small Instantaneous Field of View (IFOV) of 80 µm and a Measurement Field of View (MFOV) of 240 µm. This ensures not only reliable detection of temperature changes, but also accurate absolute temperature measurement in accordance with the camera’s specified accuracy.

Understanding the distinction between IFOV and MFOV is critical in electronics applications. IFOV determines a camera’s ability to detect temperature variation, while MFOV defines its ability to measure temperature accurately. Many infrared camera manufacturers do not specify MFOV, which can result in misleading measurements. The Xi 400 microscope system eliminates this risk, making it ideal for validating chip operating temperatures and preventing premature component failure caused by undetected overheating.

The Xi 400 infrared camera offers seamless computer connectivity via USB and supports a high frame rate of up to 80 Hz, enabling accurate monitoring of fast thermal processes. The line-scan mode is particularly effective for dynamic applications where rapid thermal changes must be captured in real time.

Advanced thermal data extraction and analysis are enabled through the PIX Connect software platform. Features include time-versus-temperature logging, with data stored in CSV format at user-defined intervals, as well as calibrated image sequences and radiometric TIFF files. The Snapshot Sequence Storage function also allows full temperature matrices to be exported for detailed analysis.

For fault detection and diagnostics, users can optimise temperature display settings to highlight even the smallest temperature increases. An image subtraction function further enhances analysis by comparing live thermal images with reference states, clearly revealing thermal differences such as short circuits or abnormal current flow on PCBs.

The Xi 400 microscope system includes analogue and digital outputs, along with a configurable process interface, enabling direct integration into machinery, test systems and automation platforms. Software development kits (SDKs)are available for engineers and system integrators developing application-specific monitoring or inspection solutions.

With its precise optics, high frame rate and advanced analysis tools, the Optris Xi 400 with microscope optics provides a powerful yet cost-effective solution for electronics R&D, PCB validation, fault detection and thermal optimisation in modern electronic design and manufacturing environments.